Shows
3D InCites PodcastRevolutionizing Semiconductor Quality: The Dynamic Planar CT AdvantageSend us a textAndrew Mathers, Principal Product Line Manager at Nordson Test and Inspection, discusses the revolutionary advancements in 3D x-ray inspection technology and how they're improving semiconductor manufacturing quality.• X-ray inspection requires high resolution, speed, and cost-effectiveness to drive better product quality• Traditional 2D radiographic imaging is being replaced by 3D imaging for more stringent manufacturing requirements• Planar CT imaging suffers from artifacts when inspecting flat electronic components like circuit boards and wafers• Dynamic Planar CT takes more images from different angles with a wider field of view, reducing artifacts• Ne...2025-05-2220 min